
Rapid Temperature Test Chamber Selection Guide
When selecting a rapid temperature test chamber, engineers often begin by comparing temperature range and ramp rate. These specifications are important, but they do not
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This is a customized HAST test chamber with a double-slot/double-layer structure, divided into upper and lower test areas. Each test area is equipped with a separate controller, allowing for two different tests to be performed simultaneously, which enhances test efficiency. The interior of the HAST chamber features a barrel structure designed to effectively prevent condensation and dripping from the top. Additionally, the internal material is welded with SUS316 stainless steel, which offers strong corrosion resistance and increased durability.
HAST test chambers can be used to conduct high-voltage, high-temperature, unsaturated/saturated damp heat tests on IC packaging, semiconductors, microelectronic chips, magnetic materials, and other electronic components. Through highly accelerated stress testing, product defects are quickly identified, helping designers evaluate the sealing and aging performance of products and improve product design.
Model | HAST2-55 |
Test Volume | 150L |
Inner Dimensions (mm) | Φ550*D650 |
External Dimensions (mm) | W1180*H1982*D1460 |
Temperature Range | +105℃ to +135℃ |
Temperature Fluctuation | ± 0.5°C |
Temperature Uniformity | ≤ ±3.0°C |
Temperature Deviation | ≤ ±3.0°C |
Humidity Range | 65%RH to 100%(Unsaturation control) 100%RH (Saturation control ) |
Humidity Fluctuation | ±3.0%RH |
Humidity Deviation | ±5.0%RH |
Temperature Change Rate | ±25ºC to +135ºC within 45 min (average in whole process) ( no-load,no heating) |
Pressure Range | Gauge pressure: +0.2 to 200kPa Absolute pressure: 100 to 300kPa |
Pressurization Time | Normal Pressure to 200kPa within 20 min |
Pressure Deviation | ≤ ±2 kPa |
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