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HAST (PCT) Chamber

HAST (PCT) Chamber

  • Highly accelerated stress test
  • Achieves shorter test times
  • Available in different capacity types
  • Safe and reliable door lock by electric clamp system   
  • Customizable specimen signal terminals
  • Conforms to various testing standards for semiconductors.
  • Programmable touch screen controller
  • Multilingual user interface
  • RS485, Ethernet communication port, USB download port    
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